Radiation testing of electro-optic devices in compliance with IEEE 1156.4
Roger A. Greenwell, David W. Pentrack, C. J. Pallach, Richard A. Tripoli, Larry A. Sadler, G. R. Waldsmith, Steven R. Terwilliger · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999
Cumulative effects on electro-optic devices are presented based on the test results of combined temperature, vacuum and total dose gamma irradiation. The survivability criteria were established in IEEE Standard 1156.4. Testing of a PIN diode and an infrared light emitting diode, under thermal vacuum conditions to a total dose of 2 Mrads, was undertaken.