Efficient BIST design for sequential machines using FiF-FoF values in machine states
Souvik Roy, Ujjwal Maulik, S. Bandyopadhyay, S Basu, Biplab Kumar Sikdar · 2003
This paper introduces a novel BIST-quality metric termed as the FiF -- FoF (Fan-in-Factor & Fan-out-Factor) defined on FSM-states. Based on the FiF -- FoF analysis, an efficient scheme is presented that ensures all state codes appear with uniform likelyhood at the present state (PS) lines during the test phase. This results in higher fault efficiency in a BIST structure. Experimental results on MCNC benchmarks show that the scheme improves fault efficiency of sequential circuits significantly, with marginal area overhead.