A Novel Method for Reducing Metal Variation With Statistical Static Timing Analysis
Eric A. Foreman, Peter A. Habitz, Ming‐C. Cheng, Chandu Visweswariah · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2012
Process variation continues to increase with new technologies. With the advent of statistical static timing analysis (SSTA), multiple independent sources of variation can be modeled. This paper proposes a novel technique to reduce variability of metal process variation in SSTA. This novel method maximizes sensitivity cancellation to minimize variability. The developed methodology is simulated with SSTA in 65-nm technology and shows a reduction in variability.