Predicting system-level test and in-field customer failures using data mining
Harry H. Chen, Roger Hsu, PaulYoung Yang, J. J. Shyr · 2013
This paper describes our deployment of data mining techniques during final test to predict system level test failures and customer returns for two recent mixed-signal system-on-chip products. Emphasis is put on practical considerations for simplifying test flow implementation while still meeting the twin goals of reduced test cost and improved product quality.