P‐92: Rapid and Non‐destructive Lifetime Estimation Method for LED Backlight Displays
S. J. Lin, Chi Sheng Chang, Tony Yang, Chang Shin Wu, Chen Cheng Chuan · SID Symposium Digest of Technical Papers · 2011
Abstract In this paper we will display a new method for measuring the temperature of a LED backlight display. Generally the LED junction temperature (Tj) is the key factor for lifetime estimation and it can be measured by the forward voltage variation when the LED is turned on under small driving current. Unfortunately the forward voltage measurement is a destructive and non‐direct method for the display and we can get only a few LED information. We found that by recording the Wp (peak wavelength) of the display spectrum, a non‐destructive LED backlight display lifetime evaluation method can be developed. By also, the lifetime of the display can be calculated simply.