Optical/digital invariant recognition of two‐dimensional patterns with straight lines
Hyun Huh · Optical Engineering · 1996
A novel optodigital pattern recognition method that has shift, rotation, and scale invariant properties is proposed for recognizing 2-D images having straight lines. The proposed method is composed of three stages. In the first stage, the line features of the image are extracted. The second stage imposes shift, rotation, and scale invariant properties on the extracted features through the proposed operations. In the last stage, an artificial feed forward neural network is trained with the extracted features. To evaluate the proposed algorithm, nine different edgeenhanced images are utilized as the experimental patterns. The successful recognition results through the optodigital experiment are presented.