Fault location in cutpoint cellular arrays
K.L. Kodandapani, Sowmitri Swamy · Proceedings of the Institution of Electrical Engineers · 1976
A systematic procedure to locate a faulty cell in a column (row) of the main array (rotated array) in cutpoint cellular arrays is presented. It is assumed that a cell failure may be due to stuck-at faults at the input/output leads of the cell or due to stuck-at faults within the cell.