Hierarchical test generation and design for testability of ASPPs and ASIPs
Indradeep Ghosh, Anand Raghunathan, Niraj Kumar Jha · 1997
Abstract — In this paper, we present design for testability (DFT) and hierarchical test generation techniques for facilitating the testing of application-specific programmable processors (ASPP’s) and application-specific instruction processors (ASIP’s). The method utilizes the register-transfer level (RTL) circuit description of an ASPP or ASIP to come up with a set of test microcode patterns which can be written into the instruction read-only memory (ROM) of the processor. These lines of microcode dictate a new control/data flow in the circuit and can be used to test modules which are not easily testable. The new control/data flow is used to justify precomputed test sets of a module from the system primary inputs to the module inputs and propagate output responses from the module output to the system primary outputs. The testability analysis, which is based on the relevant control/data flow extracted from the RTL circuit,