Microprocessor test and verification
Magdy S. Abadir, S. Dasgupta · IEEE Design & Test of Computers · 2000
Today's microprocessors consist of tens of millions of transistors operating at extraordinarily high speeds. Test and verification of these high-performance devices continuously challenge engineers in every microprocessor design cycle. This special issue presents state-of-the-art techniques for microprocessor test and verification. It aims to provide innovative ideas and new methodologies to solve the difficult challenges facing engineers in microprocessor design environments, and to inspire further research activities regarding test and verification.