Partitioning of logic circuits for exhaustive testing
Parag K. Lala, D.L. Tao · International Journal of Electronics · 1990
Exhaustive testing of logic circuits eliminates the need for test generation and fault modelling. However, if a circuit has a large number of inputs, exhaustive testing becomes impracticable. A possible solution is to partition a circuit into subcircuits, each subcircuit having few enough inputs so that all possible combinations of its inputs can be applied to it. This paper presents such a partitioning technique.