Test generation of complex digital systems including sequential modules
Zejian Liu, Hua Liu, Tianrong Zhou, Fengyao Hu · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1996
According to hierarchical design methodology, complex digital systems are composed of a number of modules interconnected by nets. This paper presents a high level test generation which is accomplished in two steps. The first step is the test generation of individual modules in isolation. A graph theoretic approach for generating optimal test sequence for sequential modules is developed. The second step is test generation of these modules in the complex digital system one by one. When one module is under consideration for test generation, the others constitute the signal propagation paths. This task is to transform the module I/O sequence into primary I/O sequence for testing and is performed by the forward and backward evaluation procedures developed in this paper. Besides, to guarantee the completeness of the test, the concise and precise functional models for sequential circuit testing are used.