The realization of the effect of nonuniform distribution in semiconductor null networks
Yoshiki Toba, Kazuki MANO · IEEE Journal of Solid-State Circuits · 1973
Uniform and nonuniform distributed semiconductor devices suitable for null networks were experimentally fabricated and the effect of nonuniform distribution was observed. The temperature sensitivities were measured and compensating circuits are given. The devices are of wide application and suitable for integrated circuit fabrication.