Rapid UHF RFID silicon debug and production testing
Udaya Shankar Natarajan, Hemalatha Shanmugasundaram, Prachi S. Deshpande, Chin Soon Wah · 2007
Radio Frequency Identification [RFID] is an emerging and evolving wireless standard in the 900MHz and 2.5GHz ISM freq band. Market demand mandated a short product development cycle from concept to shipment. The silicon has a complex architecture with integrated digital modulation and demodulation unlike popular wireless transceivers with only RF and or Analog baseband blocks. A rapid silicon debug and test development for volume production is described. Optimum Design for testability [DFT] schemes were implemented to aid quicken silicon debug and reduce production test costs. Test results related to debug and final screening are explained. A brief overview of RFID standards, hardware and tool development is explained in the absence of established solutions. Finally a reflection about future requirements to further improve production screening efficiency for wireless silicon is discussed.