Some Aspects of the Test Generation Problem for an Application-Oriented Test of SRAM-Based FPGAs
M. Renovell · Journal of Circuits Systems and Computers · 2003
This paper presents a structural approach for testing SRAM-based FPGAs taking into account the configurability of such flexible devices. When SRAM-based FPGA testing is considered, different situations have first to be identified: namely the Application-Oriented Test situation and the Manufacturing-Oriented Test situation. This paper concentrates on Test Pattern Generation and DFT for an Application-Oriented test of SRAM-based FPGAs.