Concurrent test method for OTA-C filters
Kuen-Jong Lee, Kou-Shung Huang, Wei-Chung Wang · Electronics Letters · 1997
A new testable design method for OTA-C filters is presented. By comparing the currents consumed by the circuit under test (CUT) and the currents converted from the voltage levels of the CUT, abnormalities in the circuit components can be concurrently detected.