Polycrystal Scattering Topography, Scattering Tomography and their Perspective Fields of Application
Yasuharu Yoneda, Yoshinori Chilcaura · Zeitschrift für Naturforschung A · 1982
A concept of X-ray topography for polycrystalline materials has been proposed. In this method X-rays scattered from a specimen produce the image. Various techniques for this kind of topography are described and their characteristic features are pointed out; some of these techniques offer the possibility to make tomographic observations. The new topographic method has been applied to the observation of commercially used aluminium sheet and of wood (cedar). The discussion is extended to mechanisms of the image formation and the perspective fields of application.