A Class of Test Generators for Built-In Testing
Aboulhamid, Cerny · IEEE Transactions on Computers · 1983
Currently proposed and used schemes for built-in testing (B-I-T) use as test generators either binary counters (exhaustive testing), linear feedback shift registers (semiexhaustive testing), or ROM's containing the test vectors (prestored testing). The disadvantages of these methods have been discussed in [4], and a store-and-generate B-I-T arrangement was proposed as a compromise between the exhaustive and the prestored form of test generation. Unfortunately, no systematic method was given for producing tests.