Anomaly Detection of Polymer Resettable Circuit Protection Devices
Shunfeng Cheng, Kwok F. Tom, MICHAEL G. PECHT · IEEE Transactions on Device and Materials Reliability · 2011
As circuit protection devices, failure or abnormal behavior of polymer positive-temperature-coefficient resettable devices can cause damage to circuits. It is necessary to detect anomalies in the resettable circuit protection devices to provide early warning of failure and avoid damage to a circuit. In this paper, a novel anomaly detection method, the cross-validation-based sequential probability ratio test, is developed and applied to the failure precursor parameters of the resettable circuit protection devices to conduct anomaly detection. The cross-validation-based sequential probability ratio test integrates the advantages of both the sequential probability ratio test for in situ anomaly detection and the cross-validation technique for model parameter selection to reduce the probability of false and missed alarms in anomaly detection. The cross-validation-based sequential probability ratio test solves the model parameter selection difficulty of the traditional sequential probability ratio test and improves its performance in anomaly detection.