Accelerated Synchrotron X-ray Diffraction Data Analysis on a Heterogeneous High Performance Computing System
J Qin, Michael Bauer · Journal of Physics Conference Series · 2010
The analysis of synchrotron X-ray Diffraction (XRD) data has been used by scientists and engineers to understand and predict properties of materials. However, the large volume of XRD image data and the intensive computations involved in the data analysis makes it hard for researchers to quickly reach any conclusions about the images from an experiment when using conventional XRD data analysis software. Synchrotron time is valuable and delays in XRD data analysis can impact decisions about subsequent experiments or about materials that they are investigating. In order to improve the data analysis performance, ideally to achieve near real time data analysis during an XRD experiment, we designed and implemented software for accelerated XRD data analysis. The software has been developed for a heterogeneous high performance computing (HPC) system, comprised of IBM PowerXCell 8i processors and Intel quad-core Xeon processors. This paper describes the software and reports on the improved performance. The results indicate that it is possible for XRD data to be analyzed at the rate it is being produced.