Verifying entanglement in the Hong-Ou-Mandel dip
Megan R. Ray, S. J. van Enk · Physical Review A · 2011
The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized biphoton state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multiphoton contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.