The commonality of vector generation techniques
Scott Davidson · IEEE Design & Test of Computers · 2008
The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.