Diagnostic test generation for small delay defect diagnosis
Ruifeng Guo, Wu-Tung Cheng, Takeo Kobayashi, Kun-Han Hans Tsai · 2010
Small delay defect is becoming an important defect mechanism that leads to yield loss and performance hit in high performance VLSI designs. Small delay defects usually cause a small number of failures in production test patterns, and hence provide little evidence for logic fault diagnosis to isolate a defect. In this paper, we present a diagnostic test generation technique that targets creating more tester failures for a small delay defect in order to improve the diagnostic resolution. Experimental results show the effectiveness of the proposed technique.