Implementing built-in self-test environment for cores-based digital circuits with Verilog HDL
SUNIL RANJAN DAS, Liwu Jin, Mansour H. Assaf, Satyendra N. Biswas, Emil M. Petriu · World Journal of Engineering · 2012
The implementation of fault testing environment for embedded cores-based digital circuits is a challenging endeavor. The subject paper aims developing techniques in design verification and test architecture utilizing well-known concepts of hardware and software co-design. There are available methods to ensure correct functionality, in both hardware and software, for embedded cores-based systems but one of the most used and acceptable approaches to realize this is through the use of design-for-testability (DFT). Specifically, applications of built-in self-test (BIST) methodology in testing embedded cores are considered in the paper, with specific implementations being targeted towards the International Symposium on Circuits and Systems (ISCAS) 85 combinational benchmark circuits.