Testability measures in pseudorandom testing
S. Ercolani, Michele Favalli, M. Damiani, Piero Olivo, B. Riccò · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992
The authors present two methods for computing the fault detection probabilities in combinational networks. The methods provide a deeper insight into the effects of signal correlations caused by multiple fan-out reconvergencies and can be used in testability analysis to predict the fault coverage of pseudorandom patterns. The performances of these algorithms have been tested on significant benchmarks and compare favorably with those of previous procedures.>