Pattern classification by the Bayes machine
Claudia Diamantini, A. Spalvieri · Electronics Letters · 1995
In pattern classification one has to test which class an observation vector belongs to, paying the minimum error probability. According to the nonparametric formulation, the statistical information is given by a labelled training set. The authors show how to design a classification rule by optimising the position of code vectors of a labelled vector quantiser under the minimum error probability criterion.