A new built-in IDDQ testing method using programmable BICS
Samed Maltabas, Osman Kubilay Ekekon, Martin Margala · 2010
The paper presents a novel programmable Built In Current Sensor (BICS) topology in IBM 65 nm CMOS technology. Proposed topology has 2.086 GHz bandwidth and 38.9ps detection time. Moreover, a new built-in IDDQ test flow is proposed. Proposed test flow is applied to a charge pump. The results show 100% fault coverage for the defects that affects the output of the charge pump (CP). 97.87% overall fault coverage is achieved for the same test.