NAND flash testing: A preliminary study on actual defects
Pierre-Didier Mauroux, A. Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, S. Pravossoudovitch, Benoît Godard · 2009
Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.