A study in coverage-driven test generation
Mike Benjamin, Daniel Geist, Alan G. Hartman, Gérard Mas, Ralph M. M. Smeets, Yaron Wolfsthal · 1999
One possible solution to the verification crisis is to bridge the gap between formal verification and simulation by using hybrid techniques.This paper presents a study of such a functional verification methodology that uses coverage of formal models to specify tests.This was applied to a modern superscalar microprocessor and the resulting tests were compared to tests generated using existing methods.The results showed some 50% improvement in transition coverage with less than a third the number of test instructions, demonstrating that hybrid techniques can significantly improve functional verification.1.