Built-in Self-Test for Digital Integrated Circuits
Vishwani D. Agrawal, Chih‐Jen Lin, Paul W. Rutkowski, Shianling Wu, Y. Zorian · AT&T Technical Journal · 1994
The increasing complexity of digital integrated circuits (ICs) and the requirements of system quality and availability demand a new discipline in IC testing, known as built-in self-test (BIST). This paper introduces the basic approaches of this self-contained, reusable testing technique. It also presents different attributes of BIST schemes, their tradeoffs and available tools, and demonstrates a practical application of the schemes described.