Experiment to investigate self-testing techniques in VLSI
T.W. Williams, Ron Walther, Peter S. Bottorff, S. Das Gupta · IEE Proceedings G (Electronic Circuits and Systems) · 1985
The paper contains the results of an experiment which observes the capabilities of a linear feedback shift register network, to both generate pseudorandom test patterns and compress the results of a test. Two typical networks from an actual LSI designed machine are used.