Fault detection in word-level nanoICs using vector Boolean derivatives
Sam Lee, Fadhil Toufick Aula · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013
This paper consists of four parts: (1) The word-level representations of digital circuits which included (a) word-level arithmetic representation, (b) word-level sum-of-products representation, and (c) word-level Reed-Muller representation. (2) The three word-level nano ICs circuit designs. (3) The introduction of the vector Boolean derivative. (4) The fault detection in word-level digital circuits using the vector Boolean derivative. The formulas for deriving tests for detecting stuck-at-0 (s-a-0) and stuck-at-1(s-a-1) are given word-level digital circuit presented in in any of the three representations.