DARP: dynamically adaptable resilient pipeline design in microprocessors
Chen Hu, Sanghamitra Roy, Koushik Chakraborty · Design, Automation, and Test in Europe · 2014
In this paper, we demonstrate that the sensitized path delays in various microprocessor pipe stages exhibit intriguing temporal and spatial variations during the execution of real world applications. To effectively exploit these delay variations, we propose Dynamically Adaptable Resilient Pipeline (DARP)--a series of runtime techniques to boost power performance efficiency and fault tolerance in a pipelined microprocessor. DARP employs early error prediction to avoid a major portion of the timing errors. Using a rigorous circuit-architectural infrastructure, we demonstrate substantial improvements in the performance (9.4--20%) and energy efficiency (6.4--27.9%), compared to state-of-the-art techniques.