PDF testability of the circuits derived by special covering ROBDDs with gates
Anzhela Yu. Matrosova, E. Nikolaeva, Dmitry V. Kudin, Virendra Pal Singh · 2013
Circuits obtained by covering ROBDD nodes with special gate subcircuits are considered. Formulae derived from their structural descriptions are investigated. Based on the results of investigations algorithms of deriving test pairs for robust testable PDFs and validatable non robust testable PDFs of such circuits are developed. Possibilities of cutting calculations under finding the longest circuit paths are discussed.