DETECTING DEVICE FAILURES THROUGH SCALE-DRIVEN OBJECT MATCHING
Juan E. Vargas, John R. Bourne · Applied Artificial Intelligence · 1993
This article presents a method for detecting device failures using scale-driven object matching and discusses the use of this method to facilitate object-oriented device diagnosis. A device-independent class called scale, introduced to hide the method from the objects, provides abstraction mechanisms that facilitate knowledge acquisition and system integration. Using this class, plans for diagnosis can be generated from the mismatches resulting from comparing prototypical devices with faulty devices.