Design of universal test sequences for VLSI
Abraham Lempel, M. Cohn · IEEE Transactions on Information Theory · 1985
A test sequence is called(s,t)-universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip withsinputs. Randomized and deterministic procedures are deseribed for the design of(s,t)-universal sequences and for the signature analysis of the test outputs.