A design for test method for combination circuit
Tingting Chen, Zheying Li, Wenyong Sun · 2011
Based on analysis of measurability design method for JTAG technology, this paper brings forward a Design for Test (DFT) structure for combination circuit, using Boolean Difference Algorithm to generate the minimum test vectors set. A real combination circuit is taken as an example in this paper to prove the correctness of the DFT method by emulation result.