Accumulator-based BIST approach for stuck-open and delay fault testing
Ioannis Voyiatzis, Antonis Paschalis, Dimitrios Nikolos, Constantin Halatsis · European Design and Test Conference · 1995
In this paper a novel accumulator-based Built-In Self Test (BIST) method for complete two-pattern test generation is presented. Complete two-pattern testing has been proposed for stuck-open and delay testing. The proposed scheme is very attractive for a wide range of circuits based on data-path architectures with arithmetic units, or with accumulators containing binary adders. Our method generates all 2/sup n/(2/sup n/-1) distinct two-pattern pairs for a n-input circuit under test within 2/sup n/(2/sup n/-1) clock cycles. The proposed method can be easily modified to generate complete two-pattern tests for circuits having k, (k>n) inputs, within 2/sup k/(2/sup k/-1) clock cycles. Thus, this method is well-suited for circuits consisting of several modules with different number of inputs.