PARAMETRIC DEVIATION BASED ANALOG TEST AND DIAGNOSIS SYSTEM
Kasturi Ghosh, ARABINDA ROY, Sekhar Mondal, Baidyanath Ray · Journal of Circuits Systems and Computers · 2011
This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology are proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution.