A symmetric block-matching framework for global registration
Marc Modat, David M. Cash, Pankaj Daga, Gawin P. Winston, John S. Duncan, Sébastien Ourselin · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014
Most registration algorithms suffer from a directionality bias that has been shown to largely impact on subsequent analyses. Several approaches have been proposed in the literature to address this bias in the context of non-linear registration but little work has been done in the context of global registration. We propose a symmetric approach based on a block-matching technique and least trimmed square regression. The proposed method is suitable for multi-modal registration and is robust to outliers in the input images. The symmetric framework is compared to the original asymmetric block-matching technique, outperforming it in terms accuracy and robustness.