Feature Extraction by System Identification
Bruce A. Eisenstein, Richard J. Vaccaro · IEEE Transactions on Systems Man and Cybernetics · 1982
A method for the extraction of features for pattern recognition by system identification is presented. A test waveform is associated with a parameterized process model (PM) which is an inverse filter. The structure of the PM corresponds to the redundant information in a waveform, and the parameter values correspond to the discriminatory information. The PM used in this research is a linear predictive system whose parameters are the linear predictive coefficients (LPC's). This technique is applied to feature extraction of electrocardiograms (ECG's) for differential diagnosis. The LPC's are calculated for each ECG and used as a feature vector in a hypergeometric affine N-space spanned by the LPC's. The efficacy of this feature extraction technique is tested by three different perturbation methods, namely noise, matrix distortion, and a newly developed method called directed distortion. Both the Euclidean and Itakura distances between feature vectors in N-space are shown in increase with increasing perturbation of the template waveform. The monotonic behavior of a distance measure is a necessary attribute of a valid feature space. Thus the perturbation analyses done in this research verify the viability of using the parameters of a process model as a feature vector in a pattern recognition scheme.