Accurate characterization of error propagation in a highly parallel architecture
Venugopal R. Shamapant, Jacob A. Abraham, Daniel G. Saab · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1990
Errors caused by faults in a system manifest themselves in the output results in various patterns. These output patterns of erroneous data the nature of their propagation through the various modules of the system and their impact on the system are collectively referred to as error characerisics. This paper deals with efficient methods of obtaining these error characteristics. Both experimental and analytical approaches to the problem are considered and a probabilistic approach to this problem is proposed. The effectiveness of this approach with respect to the accuracy of results and amount of computation involved is discussed.