Boolean Difference for Fault Detection in Asynchronous Sequential Machines
M. Y. Hsiao, D. K. Chia · IEEE Transactions on Computers · 1971
The progress in integrated circuits or large-scale integration (LSI) has increased the difficulty of testing and diagnosis. This paper extends the early results of using Boolean difference to generate test patterns for sequential circuits. The theory described in this paper is based on an extended Boolean difference definition, which gives a solution to the problem of automatic generation of test patterns for asynchronous sequential circuits. A complete program written in Fortran has been tested on various examples. Results are very close to the theoretical expectation.