Method of diagnosing single bridging faults in combinational circuit
Teruhiko Yamada, Kouji Yamazaki · Systems and Computers in Japan · 1991
Abstract A diagnosis method for single bridging faults in combinational circuits is proposed. In this method the cause of an error observed at the outputs is analyzed using a diagnosis table constructed based on the circuit and its test patterns. The size of the diagnosis table is proportional to the number of nets the number of tests and much smaller than the fault dictionary. The results of experiments conducted using the test patterns for single stuck‐at faults show that the testing time is nearly proportional to the size of the circuit and that the number of possible fault locations can be reduced to 20 to 30. Hence, it is expected that by conducting fault simulations for those fault possibilities, a maximal resolution can be obtained within a reasonable amount of computation time.