A weighted random pattern test generation system
R. Kapur, S. Patil, T.J. Snethen, T.W. Williams · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1996
This paper describes a weight generation algorithm that is driven by tests created by a test generator. New concepts with regard to throwing away ineffective weight sets are developed as an integral part of the system. Various parameters that help improve the effectiveness of the weight generation system are discussed.