Using remote update controller of FPGA's as built-in self test for embedded systems
Christian Stoerte · 2013
This paper is an approach of a reliable built-in self test (BIST) on FPGA based embedded systems (e.g. digital TV receivers, compact head-ends, etc.), which could easily be executed by consumers. The proposed technology is quite similar to boundary scan testing via JTAG-Interface, which is a well-established method during production to find hardware errors on a circuit design at an early stage during the manufacturing process. In contrast to boundary scan the BIST is implemented as a part of factory image in state of the art FPGA's and could be activated by graphical user interface. Since the factory image part of the firmware will never be updated by consumers, the BIST is always available even if a previous application firmware update has been failed. This offers a comfortable customer service, because in case of any support questions hardware errors could be excluded before complex assistance for configurations and firmware updates begins.