Generation of Mixed Test Sets for Transition Faults
Irith Pomeranz · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2011
Test sets that contain both broadside and skewed-load tests are important for achieving the highest possible delay fault coverage for standard-scan circuits. Both types of tests can be represented as 〈s1, v1, s2, v2〉, where s1and s2are states, and v1and v2are primary input vectors. To facilitate the generation of a mixed test set that contains both broadside and skewed-load tests, this paper associates with s2a property that can be used for estimating whether a skewed-load or a broadside test is more likely to exist with s2in its second pattern. This paper uses this property for guiding a test generation procedure to consider only one of the two test types for most of the target faults.