Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
Yu. V. Borodina · Moscow University Mathematics Bulletin · 2008
A method for synthesis of easily testable circuits of functional elements is proposed in the Zhegalkin basis for arbitrary Boolean functions. Faults are assumed to be single-type constant faults of type “1” at outputs of elements. It is proved that for such circuits the length of a single-fault test is equal to 1.