C-testability of two-dimensional sequential arrays
Wei Kang Huang, Fabrizio Lombardi · International Journal of Electronics · 1990
A technique is presented for making C-testable arbitrary two-dimensional orthogonal arrays made of sequential cells. This technique is an extention of previous techniques used for arrays made of combinational cells. A single faulty cell model is assumed. Additional states are added to the original state table of a cell. Five additional states in each direction of signal flow are required. The number of test vectors required to C-test this array is given by (2 m + l)(2n + t)(p + 5l(m + n + 1) + q), where m and n are the number of input states in the two orthogonal directions of signal flow, p is the number of test vectors required to test a basic cell of the array, l is the number of sequential (internal) state values and q is the length of the reset sequence to set the internal states of all cells in the array to the initial states. Appropriate test sequences are presented.