System Reliabilities When Using Triple Modular Redundancy in Quantum-Dot Cellular Automata
Timothy J. Dysart, Peter Michael Kogge · 2008
Nanoelectronic systems are extremely likely to demonstrate high defect and fault rates. As a result, defect and/or fault tolerance may be necessary at several levels throughout the system. Methods for improving defect tolerance, in order to prevent faults, at the component level for QCA have been studied. However, methods and results considering fault tolerance in QCA have received less attention. In this paper, we present an analysis of how QCA system reliability may be impacted by using various triple modular redundancy schemes.