Two case studies for Level Sensitive Scan Design methodology
Celso F. V. Brites, Augusto C. F. Morais · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1990
This work intend to provide an overview of some implementation aspects of Design of Testability through Level Sensitive Scan Design (LSSD) Techniques in two different IC designs developed by the IC Design Group at IBM Brasil Hardware Technology Center. Aspects include LSSD Design Methodology, test pin overhead, logic overhead, fault coverage, and test generation effort.